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Defect density of ultra-thin gate oxides grown by conventional oxidation processes
Publication:
Defect density of ultra-thin gate oxides grown by conventional oxidation processes
Date
1994
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Depas, Michel
;
Vermeire, Bert
;
Mertens, Paul
;
Schaekers, Marc
;
Meuris, Marc
;
Heyns, Marc
Journal
Abstract
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2092
since deposited on 2021-09-29
Acq. date: 2025-10-24
Citations
Metrics
Views
2092
since deposited on 2021-09-29
Acq. date: 2025-10-24
Citations