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Real Vth instability of pMOSFETs under practical operation conditions

dc.contributor.authorZhang, J. F.
dc.contributor.authorJi, Z.
dc.contributor.authorChang, M. H.
dc.contributor.authorKaczer, Ben
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-16T21:58:02Z
dc.date.available2021-10-16T21:58:02Z
dc.date.issued2007-12
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13259
dc.sourceIIOimport
dc.titleReal Vth instability of pMOSFETs under practical operation conditions
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage817
dc.source.endpage820
dc.source.conferenceTechnical Digest International Electron Devices Meeting - IEDM
dc.source.conferencedate10/12/2007
dc.source.conferencelocationWashington, DC USA
imec.availabilityPublished - open access


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