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Negative bias temperature instability on Si-passivated Ge-interface
Publication:
Negative bias temperature instability on Si-passivated Ge-interface
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Date
2008
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Aoulaiche, Marc
;
Kaczer, Ben
;
De Jaeger, Brice
;
Houssa, Michel
;
Martens, Koen
;
Degraeve, Robin
;
Roussel, Philippe
;
Mitard, Jerome
;
De Gendt, Stefan
;
Maes, Herman
;
Groeseneken, Guido
;
Meuris, Marc
;
Heyns, Marc
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Acq. date: 2025-12-16
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Views
1850
since deposited on 2021-10-17
1
last month
Acq. date: 2025-12-16
Citations