Results of low-frequency noise in submicron nMOSFETs processed by a 0.35mm CMOS technology

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Authors
Lukyanchikova, N. B.; Petrichuk, M. V.; Garbar, N. P.; Simoen, Eddy; Claeys, Cor
Conference
Proceedings 3rd ELEN Workshop
Title
Results of low-frequency noise in submicron nMOSFETs processed by a 0.35mm CMOS technology
Publication type
Proceedings paper
Embargo date
9999-12-31
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