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Strong low-frequency noise in buried-channel pMOSFETs under inverse conditions

dc.contributor.authorLukyanchikova, N.
dc.contributor.authorPetrichuk, M.
dc.contributor.authorGarbar, N.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-29T14:44:12Z
dc.date.available2021-09-29T14:44:12Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1334
dc.sourceIIOimport
dc.titleStrong low-frequency noise in buried-channel pMOSFETs under inverse conditions
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage134
dc.source.endpage140
dc.source.conference6th Quantum 1/f Noise and Other Low frequency Fluctuations in Electronic Devices Symposium
dc.source.conferencedate27/05/1994
dc.source.conferencelocationSt. Louis, MO USA
imec.availabilityPublished - open access
imec.internalnotesAIP Conf. Proceedings; Vol. 371


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