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Evaluation of a new dielectric surface treatment for organic CMOS technology

dc.contributor.authorBode, Dieter
dc.contributor.authorSchols, Sarah
dc.contributor.authorRolin, Cedric
dc.contributor.authorDebucquoy, Maarten
dc.contributor.authorGelinck, Gerwin
dc.contributor.authorGenoe, Jan
dc.contributor.authorHeremans, Paul
dc.date.accessioned2021-10-17T06:18:54Z
dc.date.available2021-10-17T06:18:54Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13399
dc.sourceIIOimport
dc.titleEvaluation of a new dielectric surface treatment for organic CMOS technology
dc.typeOral presentation
dc.contributor.imecauthorBode, Dieter
dc.contributor.imecauthorSchols, Sarah
dc.contributor.imecauthorRolin, Cedric
dc.contributor.imecauthorDebucquoy, Maarten
dc.contributor.imecauthorGenoe, Jan
dc.contributor.imecauthorHeremans, Paul
dc.contributor.orcidimecDebucquoy, Maarten::0000-0001-5980-188X
dc.contributor.orcidimecGenoe, Jan::0000-0002-4019-5979
dc.contributor.orcidimecHeremans, Paul::0000-0003-2151-1718
dc.source.peerreviewno
dc.source.conferenceInternational Conference on Organic Electronics - ICOE
dc.source.conferencedate16/06/2008
dc.source.conferencelocationEindhoven The Netherlands
imec.availabilityPublished - imec


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