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Capacitance-voltage (CV)characterization of GaAs-oxide interfaces

dc.contributor.authorBrammertz, Guy
dc.contributor.authorLin, H.C.
dc.contributor.authorMartens, Koen
dc.contributor.authorMercier, David
dc.contributor.authorMerckling, Clement
dc.contributor.authorPenaud, Julien
dc.contributor.authorAdelmann, Christoph
dc.contributor.authorSioncke, Sonja
dc.contributor.authorWang, Wei-E
dc.contributor.authorCaymax, Matty
dc.contributor.authorMeuris, Marc
dc.contributor.authorHeyns, Marc
dc.date.accessioned2021-10-17T06:23:02Z
dc.date.available2021-10-17T06:23:02Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13445
dc.sourceIIOimport
dc.titleCapacitance-voltage (CV)characterization of GaAs-oxide interfaces
dc.typeProceedings paper
dc.contributor.imecauthorBrammertz, Guy
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorAdelmann, Christoph
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecBrammertz, Guy::0000-0003-1404-7339
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.contributor.orcidimecAdelmann, Christoph::0000-0002-4831-3159
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage507
dc.source.endpage519
dc.source.conferencePhysics and Technology of High-k Dielectrics 6
dc.source.conferencedate12/10/2008
dc.source.conferencelocationHonolulu, HI USA
dc.identifier.urlhttp://www.ecsdl.org/getabs/servlet/GetabsServlet?prog=normal&id=ECSTF8000016000005000507000001&idtype=cvips&gifs=Yes
imec.availabilityPublished - imec
imec.internalnotesECS Transactions; Vol. 16, issue 5


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