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Silicon-on-insulator microspectrometer

dc.contributor.authorBrouckaert, Joost
dc.contributor.authorSelvaraja, Shankar
dc.contributor.authorBogaerts, Wim
dc.contributor.authorRoelkens, Gunther
dc.contributor.authorLing, M.Y.
dc.contributor.authorAllaert, Jeroen
dc.contributor.authorDumon, Pieter
dc.contributor.authorVan Thourhout, Dries
dc.contributor.authorBaets, Roel
dc.date.accessioned2021-10-17T06:24:26Z
dc.date.available2021-10-17T06:24:26Z
dc.date.issued2008-11
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13458
dc.sourceIIOimport
dc.titleSilicon-on-insulator microspectrometer
dc.typeProceedings paper
dc.contributor.imecauthorBogaerts, Wim
dc.contributor.imecauthorRoelkens, Gunther
dc.contributor.imecauthorVan Thourhout, Dries
dc.contributor.imecauthorBaets, Roel
dc.contributor.orcidimecBogaerts, Wim::0000-0003-1112-8950
dc.contributor.orcidimecRoelkens, Gunther::0000-0002-4667-5092
dc.contributor.orcidimecVan Thourhout, Dries::0000-0003-0111-431X
dc.contributor.orcidimecBaets, Roel::0000-0003-1266-1319
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage7
dc.source.endpage10
dc.source.conferenceAnnual Symposium of the IEEE/LEOS Benelux Chapter
dc.source.conferencedate27/11/2008
dc.source.conferencelocationTwente The Netherlands
imec.availabilityPublished - open access


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