Hot electron degradation of the DC and microwave performance of InAlAs/InGaAs/InP HEMTs

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Authors
Menozzi, R; Borgarino, M.; Baeyens, Yves; Van Hove, Marleen; Fantini, F.
Conference
Proceedings of the 26th European Solid-State Device Research Conference - ESSDERC
Title
Hot electron degradation of the DC and microwave performance of InAlAs/InGaAs/InP HEMTs
Publication type
Proceedings paper
Embargo date
9999-12-31
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