dc.contributor.author | Mertens, Paul | |
dc.contributor.author | De Gendt, Stefan | |
dc.contributor.author | Depas, Michel | |
dc.contributor.author | Kenis, Karine | |
dc.contributor.author | Opdebeeck, Ann | |
dc.contributor.author | Snee, Peter | |
dc.contributor.author | Gräf, D. | |
dc.contributor.author | Brown, G. | |
dc.contributor.author | Heyns, Marc | |
dc.date.accessioned | 2021-09-29T15:13:36Z | |
dc.date.available | 2021-09-29T15:13:36Z | |
dc.date.issued | 1996 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1347 | |
dc.source | IIOimport | |
dc.title | Effect of Fe contamination on quality of poly silicon gate structures | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Mertens, Paul | |
dc.contributor.imecauthor | De Gendt, Stefan | |
dc.contributor.imecauthor | Kenis, Karine | |
dc.contributor.imecauthor | Opdebeeck, Ann | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.orcidimec | De Gendt, Stefan::0000-0003-3775-3578 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 33 | |
dc.source.endpage | 36 | |
dc.source.conference | Proceedings of the 3rd International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS | |
dc.source.conferencedate | 23/09/1996 | |
dc.source.conferencelocation | Antwerpen Belgium | |
imec.availability | Published - open access | |