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STM analysis of acceptor states near the semiconductor/vacuum interface

dc.contributor.authorCelebi, C.
dc.contributor.authorSilov, A. Yu.
dc.contributor.authorKoenraad, P. M.
dc.contributor.authorVan Roy, Wim
dc.contributor.authorMonakhov, A. M.
dc.contributor.authorTang, J.-M.
dc.contributor.authorFlatte, M. E.
dc.date.accessioned2021-10-17T06:28:08Z
dc.date.available2021-10-17T06:28:08Z
dc.date.issued2008-08
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13491
dc.sourceIIOimport
dc.titleSTM analysis of acceptor states near the semiconductor/vacuum interface
dc.typeProceedings paper
dc.contributor.imecauthorVan Roy, Wim
dc.contributor.orcidimecVan Roy, Wim::0000-0003-3232-1987
dc.source.peerreviewyes
dc.source.conference29th International Conference on the Physics of Semiconductors - ICPS-29
dc.source.conferencedate27/07/2008
dc.source.conferencelocationRio de Janeiro Brazil
imec.availabilityPublished - imec


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