Modeling the gate current 1/f noise and its application to advanced CMOS devices

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Authors
Crupi, F.; Magnone, P.; Iannacone, G.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor
Conference
9th International Conference on Solid-State and Integrated-Circuit Technology - IC-SICT
Title
Modeling the gate current 1/f noise and its application to advanced CMOS devices
Publication type
Proceedings paper
Embargo date
9999-12-31
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