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Extraction of a large set of laser parameters from different measurements

dc.contributor.authorMorthier, Geert
dc.contributor.authorVerhoeve, Piet
dc.contributor.authorBaets, Roel
dc.contributor.authorSchatz, R.
dc.date.accessioned2021-09-29T15:13:53Z
dc.date.available2021-09-29T15:13:53Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1361
dc.sourceIIOimport
dc.titleExtraction of a large set of laser parameters from different measurements
dc.typeProceedings paper
dc.contributor.imecauthorMorthier, Geert
dc.contributor.imecauthorBaets, Roel
dc.contributor.orcidimecMorthier, Geert::0000-0003-1819-6489
dc.contributor.orcidimecBaets, Roel::0000-0003-1266-1319
dc.source.peerreviewno
dc.source.beginpage175
dc.source.endpage176
dc.source.conferenceConference Digest. 15th IEEE International Semiconductor Laser Conference; 13-18 Oct. 1996; Haifa, Israel.
dc.source.conferencelocation
imec.availabilityPublished - imec


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