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Two-dimensional carrier profile characterization for junction engineering in advanced devices

dc.contributor.authorEyben, Pierre
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-17T07:03:58Z
dc.date.available2021-10-17T07:03:58Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13712
dc.sourceIIOimport
dc.titleTwo-dimensional carrier profile characterization for junction engineering in advanced devices
dc.typeOral presentation
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorVandervorst, Wilfried
dc.source.peerreviewno
dc.source.conferenceESSDERC Tutorial Session on Characterisation for the Nanoelectronics Era
dc.source.conferencedate15/09/2008
dc.source.conferencelocationEdinburgh UK
imec.availabilityPublished - imec


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