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Correlation between flicker noise and current linearity in ferromagnetic-GaAs-metal tunnel contacts

dc.contributor.authorFobelets, K
dc.contributor.authorRumyantsev, S.
dc.contributor.authorVan Roy, Wim
dc.contributor.authorVanheertum, R.
dc.contributor.authorShur, M.S.
dc.date.accessioned2021-10-17T07:07:41Z
dc.date.available2021-10-17T07:07:41Z
dc.date.issued2008-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13731
dc.sourceIIOimport
dc.titleCorrelation between flicker noise and current linearity in ferromagnetic-GaAs-metal tunnel contacts
dc.typeProceedings paper
dc.contributor.imecauthorVan Roy, Wim
dc.contributor.orcidimecVan Roy, Wim::0000-0003-3232-1987
dc.source.peerreviewno
dc.source.beginpage553
dc.source.endpage556
dc.source.conferenceProceedings 26th International Conference on Microelectronics - MIEL
dc.source.conferencedate11/05/2008
dc.source.conferencelocationNis Serbia
imec.availabilityPublished - imec


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