Authors

Ogier, Jean-Luc; Degraeve, Robin; Groeseneken, Guido; Maes, Herman

Conference

Proceedings of the 26th European Solid-State Device Research Conference - ESSDERC

Title

On the polarity dependence of oxide breakdown in MOS-devices with n+ and p+ polysilicon gate

Publication type

Proceedings paper

Embargo date

9999-12-31