Degradation of Si1-xGex epitxial devices by proton irradiation

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Authors

Ohyama, Hidenori; Hayama, Kiyoteru; Vanhellemont, Jan; Poortmans, Jef; Caymax, Matty; Takami, Y.; Sunaga, H.; Nashiyama, I.; Uwatoko, Y.

Issue

16

Journal

Applied Physics Letters

Volume

69

Title

Degradation of Si1-xGex epitxial devices by proton irradiation

Publication type

Journal article

Embargo date

9999-12-31

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