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Microdose and breakdown effects induced by heavy ions on sub 20-nm triple gate SOI FETs
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Authors
Griffoni, Alessio
;
Gerardin, S.
;
Meneghesso, G.
;
Paccagnella, A.
;
Simoen, Eddy
;
Put, Sofie
;
Claeys, Cor
ISSN
0018-9499
Issue
6
Journal
IEEE Transactions on Nuclear Science
Volume
55
Title
Microdose and breakdown effects induced by heavy ions on sub 20-nm triple gate SOI FETs
Publication type
Journal article
Embargo date
9999-12-31
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