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Reliability issues in MuGFET nanodevices
Publication:
Reliability issues in MuGFET nanodevices
Date
2008
Proceedings Paper
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16363.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Groeseneken, Guido
;
Crupi, Felice
;
Shickova, Adelina
;
Thijs, Steven
;
Linten, Dimitri
;
Kaczer, Ben
;
Collaert, Nadine
;
Jurczak, Gosia
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1905
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1905
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations