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Reliability issues in MuGFET nanodevices
Publication:
Reliability issues in MuGFET nanodevices
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Date
2008
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Groeseneken, Guido
;
Crupi, Felice
;
Shickova, Adelina
;
Thijs, Steven
;
Linten, Dimitri
;
Kaczer, Ben
;
Collaert, Nadine
;
Jurczak, Gosia
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1906
since deposited on 2021-10-17
Acq. date: 2025-12-10
Citations
Metrics
Views
1906
since deposited on 2021-10-17
Acq. date: 2025-12-10
Citations