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Challenges and solutions for ESD protection in advanced logic and RF CMOS technologies

dc.contributor.authorGroeseneken, Guido
dc.contributor.authorThijs, Steven
dc.contributor.authorLinten, Dimitri
dc.contributor.authorScholz, Mirko
dc.contributor.authorBorremans, Jonathan
dc.contributor.authorCollaert, Nadine
dc.contributor.authorJurczak, Gosia
dc.date.accessioned2021-10-17T07:26:55Z
dc.date.available2021-10-17T07:26:55Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13818
dc.sourceIIOimport
dc.titleChallenges and solutions for ESD protection in advanced logic and RF CMOS technologies
dc.typeProceedings paper
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conference2nd International ESD Workshop - IEW
dc.source.conferencedate12/05/2008
dc.source.conferencelocationPort d'Albret France
imec.availabilityPublished - open access


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