Show simple item record

The analysis of system-level timing failures due to interconnect reliability degradation

dc.contributor.authorGuo, Jin
dc.contributor.authorPapanikolaou, Antonis
dc.contributor.authorStucchi, Michele
dc.contributor.authorCroes, Kristof
dc.contributor.authorTokei, Zsolt
dc.contributor.authorCatthoor, Francky
dc.date.accessioned2021-10-17T07:28:26Z
dc.date.available2021-10-17T07:28:26Z
dc.date.issued2008
dc.identifier.issn1530-4388
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13825
dc.sourceIIOimport
dc.titleThe analysis of system-level timing failures due to interconnect reliability degradation
dc.typeJournal article
dc.contributor.imecauthorStucchi, Michele
dc.contributor.imecauthorCroes, Kristof
dc.contributor.imecauthorTokei, Zsolt
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.source.peerreviewyes
dc.source.beginpage652
dc.source.endpage663
dc.source.journalIEEE Transactions on Device and Materials Reliability
dc.source.issue4
dc.source.volume8
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record