The analysis of system-level timing failures due to interconnect reliability degradation

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Authors

Guo, Jin; Papanikolaou, Antonis; Stucchi, Michele; Croes, Kristof; Tokei, Zsolt; Catthoor, Francky

ISSN

1530-4388

Issue

4

Journal

IEEE Transactions on Device and Materials Reliability

Volume

8

Title

The analysis of system-level timing failures due to interconnect reliability degradation

Publication type

Journal article

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