Publication:
The analysis of system-level timing failures due to interconnect reliability degradation
Date
| dc.contributor.author | Guo, Jin | |
| dc.contributor.author | Papanikolaou, Antonis | |
| dc.contributor.author | Stucchi, Michele | |
| dc.contributor.author | Croes, Kristof | |
| dc.contributor.author | Tokei, Zsolt | |
| dc.contributor.author | Catthoor, Francky | |
| dc.contributor.imecauthor | Stucchi, Michele | |
| dc.contributor.imecauthor | Croes, Kristof | |
| dc.contributor.imecauthor | Tokei, Zsolt | |
| dc.contributor.imecauthor | Catthoor, Francky | |
| dc.contributor.orcidimec | Croes, Kristof::0000-0002-3955-0638 | |
| dc.contributor.orcidimec | Catthoor, Francky::0000-0002-3599-8515 | |
| dc.date.accessioned | 2021-10-17T07:28:26Z | |
| dc.date.available | 2021-10-17T07:28:26Z | |
| dc.date.issued | 2008 | |
| dc.identifier.issn | 1530-4388 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/13825 | |
| dc.source.beginpage | 652 | |
| dc.source.endpage | 663 | |
| dc.source.issue | 4 | |
| dc.source.journal | IEEE Transactions on Device and Materials Reliability | |
| dc.source.volume | 8 | |
| dc.title | The analysis of system-level timing failures due to interconnect reliability degradation | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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