dc.contributor.author | Ohyama, Hidenori | |
dc.contributor.author | Vanhellemont, Jan | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, C. | |
dc.contributor.author | Takami, Y. | |
dc.contributor.author | Hayama, Kiyoteru | |
dc.contributor.author | Yoshimoto, K. | |
dc.contributor.author | Sunaga, H. | |
dc.contributor.author | Kobayashi, K. | |
dc.date.accessioned | 2021-09-29T15:14:52Z | |
dc.date.available | 2021-09-29T15:14:52Z | |
dc.date.issued | 1996 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1382 | |
dc.source | IIOimport | |
dc.title | Substrate effects on the degradation of irradiated Si diodes | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.source.peerreview | no | |
dc.source.beginpage | 72 | |
dc.source.endpage | 9 | |
dc.source.conference | RADECS 95. Proceedings of the Third European Conference on Radiation Effects on Components and Systems; 18-22 Sept. 1995; arcach | |
dc.source.conferencelocation | | |
imec.availability | Published - imec | |