Show simple item record

Development of methodologies for characterizing individual carbon nanotubes and silicon nanowires for use in nanoelectronics technology

dc.contributor.authorHantschel, Thomas
dc.contributor.authorCott, Daire
dc.contributor.authorPalanne, Saku
dc.contributor.authorRichard, Olivier
dc.contributor.authorArstila, Kai
dc.contributor.authorVerhulst, Anne
dc.contributor.authorSchulz, Volker
dc.contributor.authorEyben, Pierre
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-17T07:31:10Z
dc.date.available2021-10-17T07:31:10Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13836
dc.sourceIIOimport
dc.titleDevelopment of methodologies for characterizing individual carbon nanotubes and silicon nanowires for use in nanoelectronics technology
dc.typeOral presentation
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorCott, Daire
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.source.peerreviewno
dc.source.conference4th International Conference on Nanotechnology
dc.source.conferencedate14/04/2008
dc.source.conferencelocationTokyo Japan
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record