dc.contributor.author | Hantschel, Thomas | |
dc.contributor.author | Ryan, Peter | |
dc.contributor.author | Palanne, Saku | |
dc.contributor.author | Richard, Olivier | |
dc.contributor.author | Arstila, Kai | |
dc.contributor.author | Verhulst, Anne | |
dc.contributor.author | Bender, Hugo | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.date.accessioned | 2021-10-17T07:31:25Z | |
dc.date.available | 2021-10-17T07:31:25Z | |
dc.date.issued | 2008 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/13837 | |
dc.source | IIOimport | |
dc.title | Nanoprober-based pick-and-place process for site-specific characterization of individual carbon nanotubes | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Hantschel, Thomas | |
dc.contributor.imecauthor | Richard, Olivier | |
dc.contributor.imecauthor | Verhulst, Anne | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.orcidimec | Hantschel, Thomas::0000-0001-9476-4084 | |
dc.contributor.orcidimec | Richard, Olivier::0000-0002-3994-8021 | |
dc.contributor.orcidimec | Verhulst, Anne::0000-0002-3742-9017 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1081-P17-04 | |
dc.source.conference | Carbon Nanotubes and Related Low-Dimensional Materials | |
dc.source.conferencedate | 24/03/2008 | |
dc.source.conferencelocation | San Francisco, CA USA | |
imec.availability | Published - imec | |
imec.internalnotes | MRS Symposium Proceedings; Vol. 1081E | |