Show simple item record

dc.contributor.authorHantschel, Thomas
dc.contributor.authorRyan, Peter
dc.contributor.authorPalanne, Saku
dc.contributor.authorRichard, Olivier
dc.contributor.authorArstila, Kai
dc.contributor.authorVerhulst, Anne
dc.contributor.authorBender, Hugo
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-17T07:31:25Z
dc.date.available2021-10-17T07:31:25Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13837
dc.sourceIIOimport
dc.titleNanoprober-based pick-and-place process for site-specific characterization of individual carbon nanotubes
dc.typeProceedings paper
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.source.peerreviewyes
dc.source.beginpage1081-P17-04
dc.source.conferenceCarbon Nanotubes and Related Low-Dimensional Materials
dc.source.conferencedate24/03/2008
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - imec
imec.internalnotesMRS Symposium Proceedings; Vol. 1081E


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record