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Degradation and recovery of Si1-xGex devices after proton irradiation

dc.contributor.authorOhyama, Hidenori
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorTakami, Y.
dc.contributor.authorHayama, Kiyoteru
dc.contributor.authorSunaga, H.
dc.contributor.authorNashiyama, I.
dc.contributor.authorUwatoko, Y.
dc.contributor.authorPoortmans, Jef
dc.contributor.authorCaymax, Matty
dc.date.accessioned2021-09-29T15:15:15Z
dc.date.available2021-09-29T15:15:15Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1387
dc.sourceIIOimport
dc.titleDegradation and recovery of Si1-xGex devices after proton irradiation
dc.typeOral presentation
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.source.peerreviewno
dc.source.conferenceMaterials Research Society Spring Meeting. Symposium F on GeSi and Related Compounds; April 9-11, 1996; San Francisco, Calif., U
dc.source.conferencelocation
imec.availabilityPublished - imec


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