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Radiation source dependence of degradation and recovery of irradiated Si1-xGex epitaxial devices

dc.contributor.authorOhyama, Hidenori
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorTakami, Y.
dc.contributor.authorHayama, Kiyoteru
dc.contributor.authorSunaga, H.
dc.contributor.authorPoortmans, Jef
dc.contributor.authorCaymax, Matty
dc.date.accessioned2021-09-29T15:15:24Z
dc.date.available2021-09-29T15:15:24Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1389
dc.sourceIIOimport
dc.titleRadiation source dependence of degradation and recovery of irradiated Si1-xGex epitaxial devices
dc.typeProceedings paper
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.source.peerreviewno
dc.source.beginpage66
dc.source.endpage71
dc.source.conferenceRADECS 95. Proceedings of the Third European Conference on Radiation Effects on Components and Systems; 18-22 Sept. 1995; arcach
dc.source.conferencelocation
imec.availabilityPublished - imec


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