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Ubiquitous relaxation in BTI stressing - new evaluation and insights

dc.contributor.authorKaczer, Ben
dc.contributor.authorGrasser, Tibor
dc.contributor.authorRoussel, Philippe
dc.contributor.authorMartin-Martinez, Javier
dc.contributor.authorO'Connor, Robert
dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-17T07:55:40Z
dc.date.available2021-10-17T07:55:40Z
dc.date.issued2008-04
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13935
dc.sourceIIOimport
dc.titleUbiquitous relaxation in BTI stressing - new evaluation and insights
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage20
dc.source.endpage27
dc.source.conferenceProceedings of the IEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate27/04/2008
dc.source.conferencelocationPhoenix, AZ USA
dc.identifier.urlhttp://ieeexplore.ieee.org/search/srchabstract.jsp?arnumber=4558858&isnumber=4558854&punumber=4550747&k2dockey=4558858@ieeecnfs
imec.availabilityPublished - open access


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