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Failure mechanisms for semiconductor atom probe tips

dc.contributor.authorKoelling, Sebastian
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-17T08:02:01Z
dc.date.available2021-10-17T08:02:01Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13959
dc.sourceIIOimport
dc.titleFailure mechanisms for semiconductor atom probe tips
dc.typeMeeting abstract
dc.contributor.imecauthorVandervorst, Wilfried
dc.source.peerreviewyes
dc.source.conference51st International Field Emission Symposium
dc.source.conferencedate29/06/2008
dc.source.conferencelocationRouen France
imec.availabilityPublished - imec


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