Show simple item record

Characterization of voltage and frequency dependent parasitics observed in Si passivated germanium metal gate pMOSFETs

dc.contributor.authorKrom, Raymond
dc.contributor.authorMitard, Jerome
dc.contributor.authorPlourde, Chelsea
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorMeuris, Marc
dc.contributor.authorHeyns, Marc
dc.date.accessioned2021-10-17T08:03:07Z
dc.date.available2021-10-17T08:03:07Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13963
dc.sourceIIOimport
dc.titleCharacterization of voltage and frequency dependent parasitics observed in Si passivated germanium metal gate pMOSFETs
dc.typeMeeting abstract
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.source.peerreviewyes
dc.source.conference32nd Workshop on Compound Semiconductor Devices and Integrated Circuits - WOCSDICE
dc.source.conferencedate18/05/2008
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record