dc.contributor.author | Lajaunie, L. | |
dc.contributor.author | David, M.L. | |
dc.contributor.author | Opsomer, Karl | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.contributor.author | Barbot, J.F. | |
dc.date.accessioned | 2021-10-17T08:07:18Z | |
dc.date.available | 2021-10-17T08:07:18Z | |
dc.date.issued | 2008 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/13978 | |
dc.source | IIOimport | |
dc.title | Co-germanide Schottky contacts on Ge | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Opsomer, Karl | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 107 | |
dc.source.endpage | 111 | |
dc.source.conference | Gettering and Defect Engineering in Semiconductor Technology XII | |
dc.source.conferencedate | 14/10/2007 | |
dc.source.conferencelocation | Erice Italy | |
imec.availability | Published - open access | |
imec.internalnotes | Solid State Phenomena; Vol. 131-133 | |