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dc.contributor.authorLauria, John
dc.contributor.authorAlbright, Ronald
dc.contributor.authorVladimirsky, Olga
dc.contributor.authorChen, Luoqi
dc.contributor.authorHoeks, Maarten
dc.contributor.authorVanneer, Roel
dc.contributor.authorvan Drieënhuizen, Bert
dc.contributor.authorHaspeslagh, Luc
dc.contributor.authorWitvrouw, Ann
dc.contributor.authorSchlatmann, Bart
dc.date.accessioned2021-10-17T08:10:18Z
dc.date.available2021-10-17T08:10:18Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13989
dc.sourceIIOimport
dc.titleSLM device for 193 nm lithographic applications
dc.typeMeeting abstract
dc.contributor.imecauthorHaspeslagh, Luc
dc.source.peerreviewno
dc.source.conferenceMNE
dc.source.conferencedate15/09/2008
dc.source.conferencelocationAthens Greece
imec.availabilityPublished - imec


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