Show simple item record

On the correct extraction of interface trap density of MOS devices with high-mobility semiconductor substrates

dc.contributor.authorMartens, Koen
dc.contributor.authorChui, Chi On
dc.contributor.authorBrammertz, Guy
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorKuzum, Duygu
dc.contributor.authorMeuris, Marc
dc.contributor.authorHeyns, Marc
dc.contributor.authorKrishnamohan, Tejas
dc.contributor.authorSaraswat, Krishna
dc.contributor.authorMaes, Herman
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-17T08:50:29Z
dc.date.available2021-10-17T08:50:29Z
dc.date.issued2008
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14128
dc.sourceIIOimport
dc.titleOn the correct extraction of interface trap density of MOS devices with high-mobility semiconductor substrates
dc.typeJournal article
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorBrammertz, Guy
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecBrammertz, Guy::0000-0003-1404-7339
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.source.peerreviewyes
dc.source.beginpage547
dc.source.endpage556
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue2
dc.source.volume55
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record