Authors

Martens, Koen; Chui, Chi On; Brammertz, Guy; De Jaeger, Brice; Kuzum, Duygu; Meuris, Marc; Heyns, Marc; Krishnamohan, Tejas; Saraswat, Krishna; Maes, Herman; Groeseneken, Guido

ISSN

0018-9383

Issue

2

Journal

IEEE Transactions on Electron Devices

Volume

55

Title

On the correct extraction of interface trap density of MOS devices with high-mobility semiconductor substrates

Publication type

Journal article