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Strain influence of analog performance of single-gate and FinFET SOI nMOSFETs

dc.contributor.authorMartino, J.A.
dc.contributor.authorPavanello, M.A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-17T08:52:52Z
dc.date.available2021-10-17T08:52:52Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14136
dc.sourceIIOimport
dc.titleStrain influence of analog performance of single-gate and FinFET SOI nMOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conference9th International Conference on Solid-State and Integrated-Circuit Technology - IC-SICT
dc.source.conferencedate20/10/2008
dc.source.conferencelocationBeijing China
imec.availabilityPublished - open access


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