Show simple item record

In-situ spatial analysis of RF voltage during plasma etching

dc.contributor.authorMilenin, Alexey
dc.contributor.authorde Marneffe, Jean-Francois
dc.contributor.authorStruyf, Herbert
dc.date.accessioned2021-10-17T09:02:40Z
dc.date.available2021-10-17T09:02:40Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14167
dc.sourceIIOimport
dc.titleIn-situ spatial analysis of RF voltage during plasma etching
dc.typeMeeting abstract
dc.contributor.imecauthorMilenin, Alexey
dc.contributor.imecauthorde Marneffe, Jean-Francois
dc.contributor.imecauthorStruyf, Herbert
dc.contributor.orcidimecMilenin, Alexey::0000-0003-0747-0462
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage742
dc.source.conference213th ECS Meeting
dc.source.conferencedate18/05/2008
dc.source.conferencelocationPhoenix, AZ USA
dc.identifier.urlhttp://ecsmeet5.peerx-press.org/ms_files/ecsmeet5/2007/12/20/00001552/00/1552_0_art_0_jtcndz.pdf
imec.availabilityPublished - open access
imec.internalnotesECS Meeting Abstracts; Vol. MA 2008-01


Files in this item

Thumbnail
Name:
16563.pdf
Size:
75.33Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record