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Reduction of electrical crosstalk in hybrid backside illuminated CMOS imagers using deep trench isolation

dc.contributor.authorMinoglou, Kiki
dc.contributor.authorDe Munck, Koen
dc.contributor.authorSabuncuoglu Tezcan, Deniz
dc.contributor.authorBorgers, Tom
dc.contributor.authorRuythooren, Wouter
dc.contributor.authorBogaerts, Jan
dc.contributor.authorFicai Veltroni, Iacopo
dc.contributor.authorZayer, Igor
dc.contributor.authorMeynart, Roland
dc.contributor.authorBezy, Jean-Loup
dc.contributor.authorVan Hoof, Chris
dc.contributor.authorDe Moor, Piet
dc.date.accessioned2021-10-17T09:03:58Z
dc.date.available2021-10-17T09:03:58Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14171
dc.sourceIIOimport
dc.titleReduction of electrical crosstalk in hybrid backside illuminated CMOS imagers using deep trench isolation
dc.typeProceedings paper
dc.contributor.imecauthorDe Munck, Koen
dc.contributor.imecauthorSabuncuoglu Tezcan, Deniz
dc.contributor.imecauthorBorgers, Tom
dc.contributor.imecauthorRuythooren, Wouter
dc.contributor.imecauthorVan Hoof, Chris
dc.contributor.imecauthorDe Moor, Piet
dc.contributor.orcidimecSabuncuoglu Tezcan, Deniz::0000-0002-9237-7862
dc.contributor.orcidimecBorgers, Tom::0000-0002-7878-6977
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage129
dc.source.endpage131
dc.source.conference1tth International Interconnect Technology Conference - IITC
dc.source.conferencedate2/06/2008
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - open access


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