dc.contributor.author | Poortmans, Jef | |
dc.contributor.author | Szlufcik, Jozef | |
dc.contributor.author | Duerinckx, Filip | |
dc.contributor.author | De Clercq, Koen | |
dc.contributor.author | Horzel, Jörg | |
dc.contributor.author | Vermeulen, Tom | |
dc.contributor.author | Evrard, Olivier | |
dc.contributor.author | Nijs, Johan | |
dc.contributor.author | Mertens, Robert | |
dc.date.accessioned | 2021-09-29T15:17:41Z | |
dc.date.available | 2021-09-29T15:17:41Z | |
dc.date.issued | 1996 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1419 | |
dc.source | IIOimport | |
dc.title | Defect passivation by means of PECVD-nitride and hydrogenation for crystalline Si solar cells | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Poortmans, Jef | |
dc.contributor.imecauthor | Szlufcik, Jozef | |
dc.contributor.imecauthor | Duerinckx, Filip | |
dc.contributor.imecauthor | Mertens, Robert | |
dc.contributor.orcidimec | Poortmans, Jef::0000-0003-2077-2545 | |
dc.contributor.orcidimec | Duerinckx, Filip::0000-0003-2570-7371 | |
dc.source.peerreview | no | |
dc.source.conference | Proceedings of the 6th Workshop on the Role of Impurities and Defects in Si Device Processing; | |
dc.source.conferencelocation | | |
imec.availability | Published - imec | |