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Resistive electrical switching of nonvolatile memories from electrodeposited copper tetracyanoquinodimethane (CuTCNQ)

dc.contributor.authorMuller, Robert
dc.contributor.authorKatzenmeyer, Aaron
dc.contributor.authorRouault, Olivier
dc.contributor.authorGoux, Ludovic
dc.contributor.authorWouters, Dirk
dc.contributor.authorGenoe, Jan
dc.contributor.authorHeremans, Paul
dc.date.accessioned2021-10-17T09:12:53Z
dc.date.available2021-10-17T09:12:53Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14200
dc.sourceIIOimport
dc.titleResistive electrical switching of nonvolatile memories from electrodeposited copper tetracyanoquinodimethane (CuTCNQ)
dc.typeProceedings paper
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorGenoe, Jan
dc.contributor.imecauthorHeremans, Paul
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecGenoe, Jan::0000-0002-4019-5979
dc.contributor.orcidimecHeremans, Paul::0000-0003-2151-1718
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage464
dc.source.endpage469
dc.source.conference3rd International Conference on Smart Materials Structures Systems - CIMTEC
dc.source.conferencedate8/06/2008
dc.source.conferencelocationAcireale Italy
imec.availabilityPublished - open access
imec.internalnotesAdvances in Science and Technology. Vol.54


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