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Radiation damage of Ge-on-Si devices

dc.contributor.authorOhyama, H.
dc.contributor.authorSakamoto, K.
dc.contributor.authorSukizaki, H.
dc.contributor.authorTakakura, K.
dc.contributor.authorHayama, K.
dc.contributor.authorMotoki, M.
dc.contributor.authorMatsuo, K.
dc.contributor.authorNakamura, H.
dc.contributor.authorSawada, M.
dc.contributor.authorMidorikawa, M.
dc.contributor.authorKuboyama, S.
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-17T09:26:36Z
dc.date.available2021-10-17T09:26:36Z
dc.date.issued2008
dc.identifier.issn1369-8001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14242
dc.sourceIIOimport
dc.titleRadiation damage of Ge-on-Si devices
dc.typeJournal article
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage217
dc.source.endpage220
dc.source.journalMaterials Science in Semiconductor Processing
dc.source.issue5_6
dc.source.volume11
imec.availabilityPublished - open access
imec.internalnotesE-MRS 2008 Spring Conference Symposium J: Beyond Silicon Technology: Materials and Devices for Post-Si CMOS


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