Radiation damage of Ge-on-Si devices

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Authors

Ohyama, H.; Sakamoto, K.; Sukizaki, H.; Takakura, K.; Hayama, K.; Motoki, M.; Matsuo, K.; Nakamura, H.; Sawada, M.; Midorikawa, M.; Kuboyama, S.; De Jaeger, Brice; Simoen, Eddy; Claeys, Cor

ISSN

1369-8001

Issue

5_6

Journal

Materials Science in Semiconductor Processing

Volume

11

Title

Radiation damage of Ge-on-Si devices

Publication type

Journal article

Embargo date

9999-12-31

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