Publication:

Radiation damage of Ge-on-Si devices

Date

2008
Journal article
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Author(s)

Ohyama, H.
;
Sakamoto, K.
;
Sukizaki, H.
;
Takakura, K.
;
Hayama, K.
;
Motoki, M.
;
Matsuo, K.
;
Nakamura, H.
;
Sawada, M.
;
Midorikawa, M.
;
Kuboyama, S.
;
De Jaeger, Brice  
;
Simoen, Eddy  
;
Claeys, Cor

Journal

Materials Science in Semiconductor Processing

Abstract

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