Publication:

Radiation damage of Ge-on-Si devices

Date

2008
Journal article
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dc.contributor.authorOhyama, H.
dc.contributor.authorSakamoto, K.
dc.contributor.authorSukizaki, H.
dc.contributor.authorTakakura, K.
dc.contributor.authorHayama, K.
dc.contributor.authorMotoki, M.
dc.contributor.authorMatsuo, K.
dc.contributor.authorNakamura, H.
dc.contributor.authorSawada, M.
dc.contributor.authorMidorikawa, M.
dc.contributor.authorKuboyama, S.
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-17T09:26:36Z
dc.date.available2021-10-17T09:26:36Z
dc.date.embargo9999-12-31
dc.date.issued2008
dc.identifier.issn1369-8001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14242
dc.source.beginpage217
dc.source.endpage220
dc.source.issue5_6
dc.source.journalMaterials Science in Semiconductor Processing
dc.source.volume11
dc.title

Radiation damage of Ge-on-Si devices

dc.typeJournal article
dspace.entity.typePublication
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