Publication:

Radiation damage of Ge-on-Si devices

Date

2008
Journal article
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

17765.pdf 299.97 KB

Author(s)

Ohyama, H.
;
Sakamoto, K.
;
Sukizaki, H.
;
Takakura, K.
;
Hayama, K.
;
Motoki, M.
;
Matsuo, K.
;
Nakamura, H.
;
Sawada, M.
;
Midorikawa, M.
;
Kuboyama, S.
;
De Jaeger, Brice  
;
Simoen, Eddy  
;
Claeys, Cor

Journal

Materials Science in Semiconductor Processing

Abstract

Description

Statistics

Views

2001 since deposited on 2021-10-17
1last month
Acq. date: 2026-01-26

Citations

Statistics

Views

2001 since deposited on 2021-10-17
1last month
Acq. date: 2026-01-26

Citations