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dc.contributor.authorOhyama, H.
dc.contributor.authorTakakura, K.
dc.contributor.authorNagano, T.
dc.contributor.authorHanada, M.
dc.contributor.authorKuboyama, S.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-17T09:27:16Z
dc.date.available2021-10-17T09:27:16Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14244
dc.sourceIIOimport
dc.titleDegradation and their recovery behavior of irradiated GaAlAs LEDs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage119
dc.source.endpage124
dc.source.conferenceGettering and Defect Engineering in Semiconductor Technology XII
dc.source.conferencedate14/10/2007
dc.source.conferencelocationErice Italy
imec.availabilityPublished - open access
imec.internalnotesSolid State Phenomena; Vols. 131-133


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