dc.contributor.author | Ohyama, H. | |
dc.contributor.author | Takakura, K. | |
dc.contributor.author | Nagano, T. | |
dc.contributor.author | Hanada, M. | |
dc.contributor.author | Kuboyama, S. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-17T09:27:16Z | |
dc.date.available | 2021-10-17T09:27:16Z | |
dc.date.issued | 2008 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/14244 | |
dc.source | IIOimport | |
dc.title | Degradation and their recovery behavior of irradiated GaAlAs LEDs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 119 | |
dc.source.endpage | 124 | |
dc.source.conference | Gettering and Defect Engineering in Semiconductor Technology XII | |
dc.source.conferencedate | 14/10/2007 | |
dc.source.conferencelocation | Erice Italy | |
imec.availability | Published - open access | |
imec.internalnotes | Solid State Phenomena; Vols. 131-133 | |