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Study on radiation damages of SiGe devices by irradiation

dc.contributor.authorOhyama, Hidenori
dc.contributor.authorNagano, Takashi
dc.contributor.authorTakakurairo, Kenichiro
dc.contributor.authorMidorikawa, Masahiko
dc.contributor.authorKuboyama, Satoshi
dc.contributor.authorBargallo Gonzalez, Mireia
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-17T09:28:15Z
dc.date.available2021-10-17T09:28:15Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14247
dc.sourceIIOimport
dc.titleStudy on radiation damages of SiGe devices by irradiation
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage63
dc.source.endpage65
dc.source.conferenceInternational Symposium of Integration of MEMS and Intelligent Electronics
dc.source.conferencedate23/08/2008
dc.source.conferencelocationJapan
imec.availabilityPublished - imec


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