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The impact of ash on TDDB of metal-hard-mask-etched Cu/low-k interconnects
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The impact of ash on TDDB of metal-hard-mask-etched Cu/low-k interconnects
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Date
2008
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pantouvaki, Marianna
;
Struyf, Herbert
;
Hendrickx, Dirk
;
Heylen, Nancy
;
Richard, Olivier
;
Beyer, Gerald
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1903
since deposited on 2021-10-17
Acq. date: 2025-12-17
Citations
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Views
1903
since deposited on 2021-10-17
Acq. date: 2025-12-17
Citations