Publication:
Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design
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2006 since deposited on 2021-10-17
5last month
Acq. date: 2026-05-19
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Statistics
Views
2006 since deposited on 2021-10-17
5last month
Acq. date: 2026-05-19
Citations