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Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design
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Authors
Papanikolaou, Antonis
;
Wang, Hua
;
Miranda Corbalan, Miguel
;
Catthoor, Francky
;
Dehaene, Wim
Book
VLSI-SoC: Research Trends in VLSI and Systems on Chip
Title
Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design
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