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Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design

dc.contributor.authorPapanikolaou, Antonis
dc.contributor.authorWang, Hua
dc.contributor.authorMiranda Corbalan, Miguel
dc.contributor.authorCatthoor, Francky
dc.contributor.authorDehaene, Wim
dc.date.accessioned2021-10-17T09:36:22Z
dc.date.available2021-10-17T09:36:22Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14270
dc.sourceIIOimport
dc.titleReliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design
dc.typeBook chapter
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorDehaene, Wim
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.source.peerreviewno
dc.source.beginpage119
dc.source.bookVLSI-SoC: Research Trends in VLSI and Systems on Chip
dc.source.endpage141
imec.availabilityPublished - imec
imec.internalnotesIFIP International Federation for Information Processing; Vol. 249


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