dc.contributor.author | Rathsack, Ben | |
dc.contributor.author | Scheer, Steven | |
dc.contributor.author | Kuwahara, Yuhei | |
dc.contributor.author | Kitano, Junichi | |
dc.contributor.author | Gronheid, Roel | |
dc.contributor.author | Baerts, Christina | |
dc.date.accessioned | 2021-10-17T10:06:59Z | |
dc.date.available | 2021-10-17T10:06:59Z | |
dc.date.issued | 2008 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/14363 | |
dc.source | IIOimport | |
dc.title | Finite element modeling of PAG leaching and water uptake in immersion lithography resist materials | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Scheer, Steven | |
dc.contributor.imecauthor | Gronheid, Roel | |
dc.contributor.imecauthor | Baerts, Christina | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 692315 | |
dc.source.conference | Advances in Resist Materials and Processing Technology XXV | |
dc.source.conferencedate | 24/02/2008 | |
dc.source.conferencelocation | San Jose, CA USA | |
imec.availability | Published - open access | |
imec.internalnotes | Proceedings of SPIE; vol. 6923 | |